Dielectric relaxation and impedance spectroscopy of NASICON type Na3+xZr2-xMxSi2PO12 (M = divalent, trivalent, tetravalent elements ) oxides and ion-irradiation effects
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Date
2024-10-01
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IIT Delhi
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Gas sensors, Transmission electron microscopy, X-ray diffraction, Solar cells, Dielectric mechanisms