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Electromic Theis and Dissertation
Department of Physics
Elipsometric studies of some structural aspects of amorphous Si,Ge, and Ge-Se Films
Elipsometric studies of some structural aspects of amorphous Si,Ge, and Ge-Se Films
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TH-1397_ABSTRACT.pdf
(210.83 KB)
Date
1986-10-01
Authors
Kumar, Satyendra
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Publisher
IIT Delhi
Abstract
Description
Keywords
Elasticity
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URI
http://ir.iitd.ac.in/handle/123456789/7377
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Department of Physics
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