Exploring the reliability aspects of NVM technologies for neuromorphic and digital computing

Simple item page
dc.contributor.advisorSuri, Manan
dc.contributor.authorManoj Kumar
dc.date.accessioned2023-11-17
dc.date.accessioned2024-10-29T11:19:15Z
dc.date.issued2023
dc.identifier.urihttp://10.17.50.146:4000/handle/123456789/3630
dc.relation.ispartofseriesTH7430
dc.subjectClassical computing system
dc.titleExploring the reliability aspects of NVM technologies for neuromorphic and digital computing
dc.typeThesis

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
TH-7430.pdf
Size:
593.57 KB
Format:
Adobe Portable Document Format
Download

Collections

Department of Electrical Engineering