Modeling and simulation of bias dependent behavior in GaN HEMT for RF applications
dc.contributor.author | Kaushik, Pragyey Kumar | |
dc.date.accessioned | 2025-01-02T06:46:42Z | |
dc.date.issued | 2022-10-01 | |
dc.identifier.uri | http://ir.iitd.ac.in/handle/123456789/6197 | |
dc.language.iso | en | |
dc.publisher | IIT Delhi | |
dc.subject | Material properties | |
dc.subject | GaN heterostructure | |
dc.subject | Epitaxial layers in HEMTs | |
dc.subject | Aluminum mole fraction | |
dc.subject | Parasitic resistance | |
dc.title | Modeling and simulation of bias dependent behavior in GaN HEMT for RF applications | |
dc.type | Thesis |