Dielectric relaxation and impedance spectroscopy of NASICON type Na3+xZr2-xMxSi2PO12 (M = divalent, trivalent, tetravalent elements ) oxides and ion-irradiation effects

Meena, Ramcharan2024-12-232024-10-01http://ir.iitd.ac.in/handle/123456789/5819enGas sensorsTransmission electron microscopyX-ray diffractionSolar cellsDielectric mechanismsDielectric relaxation and impedance spectroscopy of NASICON type Na3+xZr2-xMxSi2PO12 (M = divalent, trivalent, tetravalent elements ) oxides and ion-irradiation effectsThesis