Investigation of traps induced reliability issues in GaN high electron mobility transistors

Gupta, Shradha2025-01-082023-07-01http://ir.iitd.ac.in/handle/123456789/6425enLeakage currentCurrent CollapseKink effectMultiphonon ionisationThermal admittance spectroscopyInvestigation of traps induced reliability issues in GaN high electron mobility transistorsThesis