Dielectric relaxation and impedance spectroscopy of NASICON type Na3+xZr2-xMxSi2PO12 (M = divalent, trivalent, tetravalent elements ) oxides and ion-irradiation effects

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dc.contributor.authorMeena, Ramcharan
dc.date.accessioned2024-12-23T07:08:40Z
dc.date.issued2024-10-01
dc.identifier.urihttp://ir.iitd.ac.in/handle/123456789/5819
dc.language.isoen
dc.publisherIIT Delhi
dc.subjectGas sensors
dc.subjectTransmission electron microscopy
dc.subjectX-ray diffraction
dc.subjectSolar cells
dc.subjectDielectric mechanisms
dc.titleDielectric relaxation and impedance spectroscopy of NASICON type Na3+xZr2-xMxSi2PO12 (M = divalent, trivalent, tetravalent elements ) oxides and ion-irradiation effects
dc.typeThesis

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