Elipsometric studies of some structural aspects of amorphous Si,Ge, and Ge-Se Films

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dc.contributor.authorKumar, Satyendra
dc.date.accessioned2025-03-01T10:01:35Z
dc.date.issued1986-10-01
dc.identifier.urihttp://ir.iitd.ac.in/handle/123456789/7377
dc.language.isoen
dc.publisherIIT Delhi
dc.subjectElasticity
dc.titleElipsometric studies of some structural aspects of amorphous Si,Ge, and Ge-Se Films
dc.typeThesis

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