Time-dependent dielectric breakdown-reliability characterization and analysis of advanced CMOS devices

Asifa Amin2025-12-102025-07-03https://ir.iitd.ac.in/handle/123456789/7829enSemiconductorElectromigrationRadio frequencyWeibull distributionThermochemicalTime-dependent dielectric breakdown-reliability characterization and analysis of advanced CMOS devicesThesis