Reliability and DC/RF stress induced degradation in InAIGaN/GaN hemts for RF and terahertz applications

Shivansh Awasthi2026-04-282026-03-24https://ir.iitd.ac.in/handle/123456789/8135enGaN materialElectron gasThermalModel calibrationMachine learningReliability and DC/RF stress induced degradation in InAIGaN/GaN hemts for RF and terahertz applicationsThesis