TCAD based modelling of line edge-roughness and radiation effects in advanced CMOS devices

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dc.contributor.advisorDixit, Abhisek
dc.contributor.authorJha, Chandan Kumar
dc.date.accessioned2021-08-13
dc.date.accessioned2024-10-29T11:18:00Z
dc.date.issued2021
dc.identifier.urihttp://10.17.50.146:4000/handle/123456789/3494
dc.relation.ispartofseriesTH6492
dc.subjectComputer aided design Metal-Oxide Semiconductor
dc.titleTCAD based modelling of line edge-roughness and radiation effects in advanced CMOS devices
dc.typeThesis

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