Piezoresistive sensing and reliability analysis of gate-all-around junctionless transistor

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dc.contributor.authorNitish Kumar
dc.date.accessioned2025-11-19T08:59:02Z
dc.date.issued2025-06-26
dc.identifier.urihttps://ir.iitd.ac.in/handle/123456789/7804
dc.language.isoen
dc.publisherIIT Delhi
dc.subjectPower dissipation in CMOS devices
dc.subjectQuantization effects
dc.subjectElectronic devices
dc.subjectElectrical characterization
dc.subjectPiezoresistive devices design
dc.titlePiezoresistive sensing and reliability analysis of gate-all-around junctionless transistor
dc.typeThesis

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